The Philips Tecnai F30 analytical transmission electron microscope at the DLR Institute of Materials Research
Scientists use the Analytical Transmission Electron Microscope (TEM) at the DLR Institute of Materials Research in Cologne to research microstructures that are relevant for the production of high-performance materials. The large-scale facility allows microstructures to be imaged and analysed down to the atomic level.
Samples to be examined in the analytical transmission electron microscope
Two aluminium preparations thinned via electrolysis and a powder sample on perforated carbon film stretched over a copper mesh; each sample is three millimetres in diameter.
This large-scale facility at the German Aerospace Center (Deutsches Zentrum für Luft- und Raumfahrt; DLR) Institute of Materials Research in Cologne enables microstructures to be mapped and analysed down to the atomic level. The results obtained assist with investigations into the processes and mechanisms that are relevant to the production and properties of high-performance materials, as well as the damage suffered by them.
Superb resolution
Among the wide range of microscopy techniques that exist, DLR's analytical transmission electron microscopy (TEM) system – which irradiates samples with strongly accelerated electrons – is notable for its superb spatial resolution and versatility.
Analytical TEM is the only process that enables complete microstructural characterisation down to the nanometre scale. Modern materials with increasingly fine structures can thus be comprehensively described in terms of their topology, crystal structure and composition.
For instance, TEM makes it possible to investigate the lattice structure of individual nanoparticles as well as to map and analyse structural defects in metals and ceramics. The technique can also characterise the structure and composition of extremely fine alloy precipitates and identify the chemical composition of grain boundaries. These data are vital to understanding, describing and modelling the behaviour of modern materials.
Information obtained in this way can help detail the relationships between the internal structure and external properties of materials, which in turn provides the basis for developing optimised materials characterised by adapted micro and nanostructures. TEM has also proven successful for examining the causes of failures and material defects.
Contact
Volker Speelmann
Head of Research Infrastructures
German Aerospace Center (DLR)
Executive Board department for Innovation, Transfer and Research Infrastructure
